XRD Diffractometer FM-XRD-A100

XRD Diffractometer FM-XRD-A100 has a scanning range of -110° to 161° and a scanning speed between 0.0012°and 120°/min for precise angle measurement. It supports transmission mode for enhanced flexibility in data
collection. This unit offers high resolution and a strong diffraction signal for reliable results. Our XRD Diffractometer comes with a lead door interlocking device for enhanced safety.

Specifications

Scanning Range -110° to 161°
Scanning Speed 0.0012° – 120°/min
Minimum Stepping
Angle
0.0001°

2θ Angle Repeatability
Accuracy
0.0001°
Angle Positioning
Speed
1500°/min (2θ)
Structure of Angle
Measuring Instrument
Vertical angle measuring
instrument with θs-θd structure
(224-bit absolute incremental
grating)
Scanning Radius Standard 225 mm (continuously
adjustable from 150 mm to 325 mm
mm)
Drive Mode θs-θd linkage; θs or θd single action
Output Stability ≤ 0.005% (with power supply
voltage fluctuation of 10%)
Linearity of Full
Spectrum Diffraction
Angle
≤ ± 0.01° (International Standards)
Spectral Resolution 687 ± 5 [eV] (rms) (MYTHEN) or 125
[eV] (SDD)
Maximum Linear
Count Rate
1 x 10⁹ CPS (no noise, MYTHEN) or 1 x
10⁵ CPS (noise ≤ 0.2 CPS, SDD)
X-Ray Leakage ≤ 0.12 µSv/h (at maximum X-ray
tube power)
Comprehensive
Stability
≤ 0.3% (40 kV, 40 mA, continuous
operation for 8 hours)
X-Ray Tube Voltage 10–60 kV, 1 kV/step

X-Ray Tube Current 2–60 mA, 1 mA/step
Power Supply 2.4 kW / 3 kW
Dimensions (L × W ×
H)
1300 × 1000 × 1800 (mm)

Features

1. Integrates electronic Protection System
2. Ensures ultra-high resolution
3. Incorporates one-dimensional array detector
4. Inbuilt circulating cooling water device
5. Equipped with a printer

Applications

XRD Diffractometer FM-XRD-A100 is used to measure the structure, composition, and properties of materials by analyzing the way they scatter or diffract a beam of radiation and is mainly used in scientific research, the
pharmaceutical industry, and nanotechnology.